[1]
D. Baurecht, G. Reiter, N. Hassler, M. Schwarzott, and U. P. Fringeli, “Application of Special FTIR ATR Techniques for Quantitative Structural Analysis of Thin Surface Layers”, Chimia, vol. 59, no. 5, p. 226, May 2005, doi: 10.2533/000942905777676524.