Pham, D. T., Keller, H., Breuer, S., Huemann, S., Hai, N. T., Zoerlein, C., Wandelt, K., & Broekmann, P. (2009). Anion/Cation Layers at Electrified Interfaces: A Comprehensive STM, XRD and XPS Case Study. CHIMIA, 63(3), 115. https://doi.org/10.2533/chimia.2009.115