Extending Resonant Inelastic X-ray Scattering to Extreme Ultraviolet

Authors

  • Samuel Menzi Laboratory for Synchrotron Radiation and Femtochemistry, Center for Photon Science, Paul Scherrer Institut (PSI), CH-5232 Villigen, Switzerland
  • Fabio La Mattina Swiss Federal Laboratories for Materials Science and Technology (Empa), Überlandstrasse 129, CH 8600 Dübendorf
  • Francesco Barbato Swiss Federal Laboratories for Materials Science and Technology (Empa), Überlandstrasse 129, CH 8600 Dübendorf
  • Yunieski Arbelo Pena Swiss Federal Laboratories for Materials Science and Technology (Empa), Überlandstrasse 129, CH 8600 Dübendorf
  • Sven Augustin Laboratory for Synchrotron Radiation and Femtochemistry, Center for Photon Science, Paul Scherrer Institut (PSI), CH-5232 Villigen, Switzerland
  • Gregor Knopp Laboratory for Synchrotron Radiation and Femtochemistry, Center for Photon Science, Paul Scherrer Institut (PSI), CH-5232 Villigen, Switzerland
  • Marcello Coreno ELETTRA - Sincrotrone Trieste, Basovizza Area Science Park, S. S. 14 – km 163.5, I-34149, Basovizza (TS), Italy; CNR – Istituto di Struttura della Materia (ISM), in Basovizza Area Science Park, I-34149, Trieste, Italy
  • Stefano Orlando CNR – Istituto di Struttura della Materia (ISM), in Basovizza Area Science Park, I-34149, Trieste, Italy
  • Monica de Simone CNR - Istituto Officina dei Materiali (IOM), S. S. 14 - km 163.5, I-34149, Trieste, Italy
  • Paolo Miotti CNR – Istituto di Fotonica e Nanotecnologie (IFN), via Trasea 7, I-35131 Padova, Italy
  • Fabio Frassetto CNR – Istituto di Fotonica e Nanotecnologie (IFN), via Trasea 7, I-35131 Padova, Italy
  • Luca Poletto CNR – Istituto di Fotonica e Nanotecnologie (IFN), via Trasea 7, I-35131 Padova, Italy
  • Davide Bleiner Swiss Federal Laboratories for Materials Science and Technology (Empa), Überlandstrasse 129, CH 8600 Dübendorf; University of Zurich, Winterthurerstrasse 190, CH-8053, Zurich
  • Claudio Cirelli Laboratory for Synchrotron Radiation and Femtochemistry, Center for Photon Science, Paul Scherrer Institut (PSI), CH-5232 Villigen, Switzerland; Swiss Federal Laboratories for Materials Science and Technology (Empa), Überlandstrasse 129, CH 8600 Dübendorf https://orcid.org/0000-0003-4576-3805

DOI:

https://doi.org/10.2533/chimia.2025.25

Keywords:

EUV spectroscopy, Synchrotron experiments

Abstract

We present α-Al2O3 XAS, XES and RIXS measurements across the Al L2/L3 edges at about 79 eV excitation energy. In the emission spectra, we identify two fluorescence peaks, corresponding to electronic transitions into the 2p core hole from mixed states of Al 3s and Al 3d character, both mixed with O 2p orbitals. Even if the XAS spectrum shows more than one resonance, surprisingly only one clear RIXS signal with energy loss equal to 10.7 eV is present in the data. Nevertheless, this allows us to tentatively extract from the measured high-resolution data the linewidths for fluorescence and RIXS transitions, with the latter being almost a factor of two smaller than the former.

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Published

2025-02-26

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Section

Scientific Articles