Ultrafast Single-Particle Imaging with Intense X-Ray Pulses

Authors

  • Zhibin Sun Paul Scherrer Institut (PSI), 5232 Villigen PSI
  • Andre Al Haddad Paul Scherrer Institut (PSI), 5232 Villigen PSI
  • Sven Augustin Paul Scherrer Institut (PSI), 5232 Villigen PSI
  • Gregor Knopp Paul Scherrer Institut (PSI), 5232 Villigen PSI
  • Jonas Knurr Paul Scherrer Institut (PSI), 5232 Villigen PSI
  • Kirsten Schnorr Paul Scherrer Institut (PSI), 5232 Villigen PSI
  • Christoph Bostedt Paul Scherrer Institut (PSI), 5232 Villigen PSI; LUXS Laboratory for Ultrafast X-ray Sciences, Ecole Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne

DOI:

https://doi.org/10.2533/chimia.2022.529

PMID:

38069722

Keywords:

Ultrafast imaging, Free-electron laser, X-ray

Abstract

Ultrafast single-particle imaging with intense x-ray pulses from free-electron laser sources provides a new approach for visualizing structure and dynamics on the nanoscale. After a short introduction to the novel free-electron laser sources and methods, we highlight selected applications and discuss how ultrafast imaging flourishes from method development to early applications in physics and biology to opportunities for chemical sciences.

Funding data

CHIMIA Vol. 76 No. 6 (2022): Frontiers in Ultrafast Spectroscopy and Dynamics

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Published

2022-06-29

Issue

Vol. 76 No. 6 (2022): Frontiers in Ultrafast Spectroscopy and Dynamics

Section

Scientific Articles

License

Copyright (c) 2022 Zhibin Sun, Andre Al Haddad, Sven Augustin, Gregor Knopp, Jonas Knurr, Kirsten Schnorr, Christoph Bostedt

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
Z. Sun, A. Al Haddad, S. Augustin, G. Knopp, J. Knurr, K. Schnorr, C. Bostedt, Chimia 2022, 76, 529, DOI: 10.2533/chimia.2022.529.