Scanning Probe Microscopy of Atoms and Molecules on Insulating Films: From Imaging to Molecular Manipulation

Authors

  • Gerhard Meyer IBM Research – Zurich, Säumerstr. 4, CH-8803 Rüschlikon, Switzerland. gme@zurich.ibm.com
  • Leo Gross IBM Research – Zurich, Säumerstr. 4, CH-8803 Rüschlikon, Switzerland
  • Fabian Mohn IBM Research – Zurich, Säumerstr. 4, CH-8803 Rüschlikon, Switzerland
  • Jascha Repp Universität Regensburg Institut für Experimentelle u. Angewandte Physik D-93040 Regensburg, Germany

DOI:

https://doi.org/10.2533/chimia.2012.10

Keywords:

Atomic force microscopy, Insulating film, Molecular electronics, Scanning tunneling microscopy, Single molecule

Abstract

Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) of single atoms and molecules on ultrathin insulating films have led to a wealth of novel observations and insights. Based on the reduced electronic coupling to the metallic substrate, these techniques allow the charge state of individual atoms to be controlled, orbitals of individual molecules to be imaged and metal–molecule complexes to be built up. Near-contact AFM adds the unique capabilities of imaging and probing the chemical structure of single molecules with atomic resolution. With the help of atomic/molecular manipulation techniques, chemical binding processes and molecular switches can be studied in detail.

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Published

2012-02-29

How to Cite

[1]
G. Meyer, L. Gross, F. Mohn, J. Repp, Chimia 2012, 66, 10, DOI: 10.2533/chimia.2012.10.