Optical Microscopy in the Nano-World

Authors

  • Dieter W. Pohl IBM Research Division, Zürich Research Laboratory, CH-8803 Rüschlikon
  • Hermann Bach
  • Martin A. Bopp
  • Volker Deckert
  • Pierre Descouts
  • Rolf Eckert
  • Hans-Joachim Güntherodt
  • Christian Hafner
  • Bert Hecht
  • Harry Heinzelmann
  • Thomas Huser
  • Mark Jobin
  • Ursula Keller
  • Thilo Lacoste
  • Patrick Lambelet
  • Fabienne Marquis-Weible
  • Olivier J.F. Martin
  • Alfred J. Meixner
  • Bettina Nechay
  • Lukas Novotny
  • Michael Pfeiffer
  • Claude Philipona
  • Taras Plakhotnik
  • Alois Renn
  • Abdeljalil Sayah
  • Joao-Manuel Segura
  • Beate Sick
  • Uwe Siegner
  • Guido Tarrach
  • Rüdiger Vahldieck
  • Urs P. Wild
  • Dieter Zeisel
  • Renato Zenobi

DOI:

https://doi.org/10.2533/chimia.1997.760

Abstract

Scanning near-field optical microscopy (SNOM) is an optical microscopy whose resolution is not bound to the diffraction limit. It provides chemical information based upon spectral, polarization and/or fluorescence contrast images. Details as small as 20 nm can be recognized. Photophysical and photochemical effects can be studied with SNOM on a similar scale. This article reviews a good deal of the experimental and theoretical work on SNOM in Switzerland.

Downloads

Published

1997-10-29

Issue

Vol. 51 No. 10 (1997): Analytical Sciences in Switzerland

Section

Analytical Science in Switzerland

License

Copyright (c) 1997 Swiss Chemical Society

Creative Commons License

This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.

How to Cite

[1]
D. W. Pohl, H. Bach, M. A. Bopp, V. Deckert, P. Descouts, R. Eckert, H.-J. Güntherodt, C. Hafner, B. Hecht, H. Heinzelmann, T. Huser, M. Jobin, U. Keller, T. Lacoste, P. Lambelet, F. Marquis-Weible, O. J. Martin, A. J. Meixner, B. Nechay, L. Novotny, M. Pfeiffer, C. Philipona, T. Plakhotnik, A. Renn, A. Sayah, J.-M. Segura, B. Sick, U. Siegner, G. Tarrach, R. Vahldieck, U. P. Wild, D. Zeisel, R. Zenobi, Chimia 1997, 51, 760, DOI: 10.2533/chimia.1997.760.