Optical Microscopy in the Nano-World

Dieter W. Pohl; Hermann Bach; Martin A. Bopp; Volker Deckert; Pierre Descouts; Rolf Eckert; Hans-Joachim Güntherodt; Christian Hafner; Bert Hecht; Harry Heinzelmann; Thomas Huser; Mark Jobin; Ursula Keller; Thilo Lacoste; Patrick Lambelet; Fabienne Marquis-Weible; Olivier J.F. Martin; Alfred J. Meixner; Bettina Nechay; Lukas Novotny; Michael Pfeiffer; Claude Philipona; Taras Plakhotnik; Alois Renn; Abdeljalil Sayah; Joao-Manuel Segura; Beate Sick; Uwe Siegner; Guido Tarrach; Rüdiger Vahldieck; Urs P. Wild; Dieter Zeisel; Renato Zenobi

doi:10.2533/chimia.1997.760

Optical Microscopy in the Nano-World

Authors

Dieter W. Pohl IBM Research Division, Zürich Research Laboratory, CH-8803 Rüschlikon
Hermann Bach
Martin A. Bopp
Volker Deckert
Pierre Descouts
Rolf Eckert
Hans-Joachim Güntherodt
Christian Hafner
Bert Hecht
Harry Heinzelmann
Thomas Huser
Mark Jobin
Ursula Keller
Thilo Lacoste
Patrick Lambelet
Fabienne Marquis-Weible
Olivier J.F. Martin
Alfred J. Meixner
Bettina Nechay
Lukas Novotny
Michael Pfeiffer
Claude Philipona
Taras Plakhotnik
Alois Renn
Abdeljalil Sayah
Joao-Manuel Segura
Beate Sick
Uwe Siegner
Guido Tarrach
Rüdiger Vahldieck
Urs P. Wild
Dieter Zeisel
Renato Zenobi

DOI:

https://doi.org/10.2533/chimia.1997.760

Abstract

Scanning near-field optical microscopy (SNOM) is an optical microscopy whose resolution is not bound to the diffraction limit. It provides chemical information based upon spectral, polarization and/or fluorescence contrast images. Details as small as 20 nm can be recognized. Photophysical and photochemical effects can be studied with SNOM on a similar scale. This article reviews a good deal of the experimental and theoretical work on SNOM in Switzerland.

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Published

1997-10-29

How to Cite

[1]

D. W. Pohl, H. Bach, M. A. Bopp, V. Deckert, P. Descouts, R. Eckert, H.-J. Güntherodt, C. Hafner, B. Hecht, H. Heinzelmann, T. Huser, M. Jobin, U. Keller, T. Lacoste, P. Lambelet, F. Marquis-Weible, O. J. Martin, A. J. Meixner, B. Nechay, L. Novotny, M. Pfeiffer, C. Philipona, T. Plakhotnik, A. Renn, A. Sayah, J.-M. Segura, B. Sick, U. Siegner, G. Tarrach, R. Vahldieck, U. P. Wild, D. Zeisel, R. Zenobi, Chimia 1997, 51, 760, DOI: 10.2533/chimia.1997.760.