TXRF Spektrometer zum Nachweis von Spurenelementen
DOI:
https://doi.org/10.2533/chimia.1992.477Abstract
The TXRF (total reflection X-ray fluorescence) spectrometer is a very useful instrument for measuring ultratrace elements in aqueous solutions, in metals, in minerals, in biological and environmental samples etc. Elements with atomic number >13 are detected simultaneously with a minimum detection limit of pg. The sample preparation is very simple and only few ?g or ?l sample material is required.Downloads
Published
1992-12-23
Issue
Section
Forschung
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Copyright (c) 1992 Swiss Chemical Society
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How to Cite
[1]
F. Hegedüs, Chimia 1992, 46, 477, DOI: 10.2533/chimia.1992.477.