TXRF Spektrometer zum Nachweis von Spurenelementen

Authors

  • Ferenc Hegedüs

DOI:

https://doi.org/10.2533/chimia.1992.477

Abstract

The TXRF (total reflection X-ray fluorescence) spectrometer is a very useful instrument for measuring ultratrace elements in aqueous solutions, in metals, in minerals, in biological and environmental samples etc. Elements with atomic number >13 are detected simultaneously with a minimum detection limit of pg. The sample preparation is very simple and only few ?g or ?l sample material is required.

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Published

1992-12-23