Applications of Inductively Coupled Plasma Mass Spectrometry (ICP-MS) in the Central Analytical Department of Ciba-Geigy

Abstract

The present paper shows the potentialities of ICP-MS for the trace and ultra-trace analysis of different materials in an industrial laboratory. An overview is given on some applications of ICP-MS in the Central Analytical Department of Ciba-Geigy. The use of a He-MIP (Microwave Induced Plasma) as an alternative to the Ar-ICP as an ionization source for the mass spectrometer is discussed.