Sekundärionenmassenspektroskopische Untersuchungen an einem Zinkoxid-Katalysator

Authors

  • P. Fontana Technisch-Chemisches Laboratorium der Eidgenössischen Technischen Hochschule, 8006 Zürich
  • G. Gut Technisch-Chemisches Laboratorium der Eidgenössischen Technischen Hochschule, 8006 Zürich

DOI:

https://doi.org/10.2533/chimia.1974.238

Abstract

Surface studies of ZnO catalysts using secondary ion mass spectroscopy (SIMS) showed that under dehydrogenation conditions a certain amount of the surface-zinc oxide is reduced to zinc.

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Published

1974-05-31

Issue

Vol. 28 No. 5 (1974): Forschung/Research

Section

Kurze Mitteilungen

License

Copyright (c) 1974 P. Fontana

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
P. Fontana, G. Gut, Chimia 1974, 28, 238, DOI: 10.2533/chimia.1974.238.